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Enhanced dielectric constant resolution of thin insulating films by electrostatic force microscopy

机译:通过静电力显微镜增强薄绝缘膜的介电常数分辨率

摘要

This is the author’s version of a work that was accepted for publication in Journal of Physics: Condensed Matter. Changes resulting from the publishing process, such as peer review, editing, corrections, structural formatting, and other quality control mechanisms may not be reflected in this document. Changes may have been made to this work since it was submitted for publication. A definitive version was subsequently published in Journal of Physics: Condensed Matter 24.15 (2012) 10.1088/0953-8984/24/15/155303
机译:这是作者作品的版本,已被发表在《物理学杂志:凝聚态》上。由发布过程引起的更改,例如同行评审,编辑,更正,结构格式和其他质量控制机制,可能未反映在本文档中。自提交出版以来,可能对此作品进行了更改。最终版本随后发表在《物理学杂志》上:凝聚态24.15(2012)10.1088 / 0953-8984 / 24/15/155303

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